ALEXANDRIA, Va., April 7 -- United States Patent no. 12,597,115, issued on April 7, was assigned to ACV Auctions Inc. (Buffalo, N.Y.). "Systems and techniques for vehicle inspection and condition ana... और पढ़ें
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,597,116, issued on April 7, was assigned to International Business Machines Corp. (Armonk, N.Y.). "Automatic detection of mask defects in semic... और पढ़ें
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,597,117, issued on April 7, was assigned to TOYO SEIKAN Co. LTD. (Tokyo). "Method, program, apparatus, and system for abnormality detection suc... और पढ़ें
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,597,118, issued on April 7, was assigned to KONICA MINOLTA INC. (Tokyo). "Image inspection apparatus, image inspection method, and image inspec... और पढ़ें
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,597,119, issued on April 7, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Gyeonggi-do, South Korea). "Operating method of electronic device inc... और पढ़ें
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,597,120, issued on April 7, was assigned to Seiko Epson Corp. (Tokyo). "Printed image defect discrimination device and method displaying detect... और पढ़ें
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,597,122, issued on April 7, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea). "Defect detection device and method thereof" ... और पढ़ें
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,597,123, issued on April 7, was assigned to Harsco Technologies LLC (Fairmont, Minn.). "Rail feature identification system" was invented by Jav... और पढ़ें
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,597,124, issued on April 7, was assigned to SHIN-ETSU HANDOTAI Co. LTD. (Tokyo). "Debris determination method" was invented by Masato Ohnishi (... और पढ़ें
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,597,125, issued on April 7, was assigned to Canon Medical Systems Corp. (Otawara, Japan). "Apparatus and method for correcting a contour of an ... और पढ़ें